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FRANCESCO CICCARELLO

Thickness measurement of soft thin films on periodically patterned magnetic substrates by phase difference magnetic force microscopy

  • Authors: Passeri, D; Dong, C; Angeloni, L; Pantanella, F, Natalizi, T; Berlutti, F; Marianecci, C; Ciccarello, F; Rossi, M
  • Publication year: 2014
  • Type: Articolo in rivista (Articolo in rivista)
  • Key words: Thickness measurement Magnetic force microscopy Atomic force microscopy Periodic magnetic domains Bacteria
  • OA Link: http://hdl.handle.net/10447/98847