A NOVEL FREQUENCY DOMAIN METHOD FOR PREDICTING FATIGUE CRACK GROWTH UNDER WIDE BAND RANDOM LOADING
- Authors: ZUCCARELLO B; ADRAGNA NF
- Publication year: 2006
- Type: Articolo in rivista
- Key words: fatigue; crack growth; random process; power spectral density; random loading; rainflow method; stochastic analysis
- OA Link: http://hdl.handle.net/10447/13520
Abstract
This work deals with the evaluation of the fatigue crack growth rate of structural components subjected to uniaxial Gaussian stationary wide band random loading. In detail, a new frequency domain method that allows the user to estimate the expected crack growth rate directly from the PSD data is proposed. Using a stochastic mean function properly, introduced and described by simple closed form relationships implemented by systematic numerical simulations of a high number of wide band random processes, the proposed method permits to avoid the onerous time domain simulations and provides in general crack growth rate predictions in a good accordance with the so-called time domain method. Practical applications, carried out by considering various PSDs reported in the literature, have corroborated the accuracy of the proposed method. © 2006 Elsevier Ltd. All rights reserved.