Lévy noise-induced effects in a long Josephson junction in the presence of two different spatial noise distributions

Abstract

We analyze the impact of Lévy-distributed stochastic fluctuations on the average switching time and voltage drop across a current-biased long Josephson tunnel junction. We compare the system’s response for two spatial configurations of time-dependent noise, i.e., homogeneous and distributed along the junction length. The response of the Josephson junction is explored by varying the characteristic parameter of the Lévy source, i.e., the alpha stability index and the noise intensity. These findings offer an effective tool to characterize a Lévy component possibly embedded in an unknown noise signal.