Transient Dynamics of Short Josephson Junctions under the influence of non-Gaussian Noise
- Authors: Augello, G; Valenti, D; Spagnolo, B
- Publication year: 2009
- Type: Altro
- Key words: Stochastic processes; Computational methods in statistical physics and nonlinear dynamics; Noise; Josephson devices
- OA Link: http://hdl.handle.net/10447/50240
Abstract
We investigate the effects of non-Gaussian white noise source on the transient dynamics of short Josephson junctions. The noise signal is simulated generating standard stable random variables with characteristic function described by Lévy index alpha and asymmetry parameter beta. We study the lifetime of the superconductive state as a function both of the frequency of the external driving bias current and the noise intensity for different values of index alpha. We compare our results with those obtained in the presence of Gaussian white noise. We find the presence of noise induced effects such as resonant activation and noise enhanced stability.