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FRANCO MARIO GELARDI

Sintering process of amorphous SiO2 nanoparticles investigated by AFM, IR and Raman techniques

  • Authors: Buscarino, G; Ardizzone, V; Vaccaro, G; Gelardi, FM
  • Publication year: 2011
  • Type: Articolo in rivista (Articolo in rivista)
  • Key words: Fumed silica; Sintering; Atomic force microscopy; Raman; Infrared absorption
  • OA Link: http://hdl.handle.net/10447/53750

Abstract

We report an experimental investigation on the effects of thermal treatments at different temperatures (room— 1270 K) and for different duration (0–75 h) on amorphous silica nanoparticles (fumed silica) in powder tablet form. Three types of fumed silica are considered, comprising nearly spherical particles of 40 nm, 14 nmand 7 nm mean diameter. The experimental techniques used here are Raman and infrared absorption (IR) spectroscopy together with atomic force microscopy (AFM). Raman and IR spectra indicate that the structure of nanometer silica particles is significantly differentwith respect to that of a bulk silica glass. In particular, themain differences regard the positions of the IR band peaked at about 2260 cm−1, the Raman R-band peaked at about 440 cm−1 and the intensity of the D1 and the D2 Raman lines, related to the populations of 4- and 3-membered rings, respectively. Our data also indicate that, under thermal treatments, the structure of fumed silica samples is significantly changed, gradually relaxing towards that pertaining to ordinary bulk silica. These changes are interpreted here on the basis of the morphological information provided by the AFM measurements and assuming a two-shell structure for the fumed silica primary particles.