Micro-Raman characterization of graphene grown on SiC(000-1)
- Authors: Piazza, A.; Agnello, S.; Deretzis, I.; La Magna, A.; Scuderi, M.; Nicotra, G.; Spinella, C.; Fisichella, G.; Roccaforte, F.; Cannas, M.; Gelardi, F.; Yakimova, R.; Giannazzo, F.
- Publication year: 2014
- Type: Proceedings
- Key words: 4H-SiC; AFM; Graphene; STEM; μRaman; Mechanics of Materials; Materials Science (all); Instrumentation
- OA Link: http://hdl.handle.net/10447/128127
Abstract
Graphene (Gr) was grown on the C face of 4H-SiC under optimized conditions (high annealing temperatures ranging from 1850 to 1950°C in Ar ambient at 900 mbar) in order to achieve few layers of Gr coverage. Several microscopy techniques, including optical microscopy (OM), μRaman spectroscopy, atomic force microscopy (AFM) and atomic resolution scanning transmission electron microscopy (STEM) have been used to extensively characterize the lateral uniformity of the as-grown layers at different temperatures. μRaman analysis provided information on the variation of the number of layers, of the stacking-type, doping and strain.