Structural inhomogeneity of Ge-doped amorphous SiO2 probed by photoluminescence lifetime measurements under synchrotron radiation.
- Authors: AGNELLO S; BUSCARINO G; CANNAS M; MESSINA F; GRANDI S; MAGISTRIS A
- Publication year: 2006
- Type: eedings
- OA Link: http://hdl.handle.net/10447/15141