Outlier analysis and principal component analysis to detect fatigue cracks in waveguides
- Authors: Cammarata, M; Dutta, D;Rizzo, P; Sohn, H
- Publication year: 2009
- Type: eedings
- Key words: Outlier analysis,principal component analysis, fatigue cracks, waveguides
- OA Link: http://hdl.handle.net/10447/63621