Analysis of broadband x-ray spectra of highly charged krypton from a microcalorimeter detector of an electron-beam ion trap
- Autori: Kink, I.; Laming, J.; Takács, E.; Porto, J.; Gillaspy, J.; Silver, E.; Schnopper, H.; Bandler, S.; Barbera, M.; Brickhouse, N.; Murray, S.; Madden, N.; Landis, D.; Beeman, J.; Haller, E.
- Anno di pubblicazione: 2001
- Tipologia: Articolo in rivista (Articolo in rivista)
- OA Link: http://hdl.handle.net/10447/215697
Abstract
Partially resolved x-ray spectra of highly charged krypton ions (Kr) was analyzed using an electron-beam ion trap (EBIT) plasma model. A microcalorimeter detector recorded the spectra in a broad x-ray energy band. Charge state distributions of krypton ions inside the EBIT was determined. In addition, the transition energies of the spectral lines were determined with some uncertainty. Many new lines in the spectra of L-shell Kr ions were identified with some diagnostic potential applicable in plasma physics.