Structural inhomogeneity of Ge-doped amorphous SiO2 probed by photoluminescence lifetime measurements under synchrotron radiation.

Authors: AGNELLO S; BUSCARINO G; CANNAS M; MESSINA F; GRANDI S; MAGISTRIS A
Publication year: 2006
Type: Proceedings
OA Link: http://hdl.handle.net/10447/15141